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Power cycling community 1995-2014 - an overview of test results over the last 20 years

Lastwechsel-Gemeinschaft 1995-2014 - ein Überblick über die Testergebnisse der letzten 20 Jahre
: Hutzler, Aaron; Zeyss, Felix; Vater, Stephan; Tokarski, Adam; Schletz, Andreas; März, Martin

Fulltext urn:nbn:de:0011-n-2906632 (171 KByte PDF)
MD5 Fingerprint: 56cebdda8749839644dde1feb371eba7
Created on: 19.6.2015

Bodo's power systems (2014), No.05-14, pp.78-81
ISSN: 1863-5598
Journal Article, Electronic Publication
Fraunhofer IISB ()
active power cycling; literature review; reliability; lifetime test

Semiconductor lifetime is a key factor for economical and sustainable use of power electronics. To assess the lifetime of power electronic modules, active power cycling tests are a state-of-the-art procedure. This article shows the results of 110 publications from the last 20 years related to samples per test run, temperature swing, coolant temperature and cycling time.