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Moisture as stress factor for PV-modules

 
: Köhl, M.

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers -IEEE-, Power & Energy Society -PES-:
39th IEEE Photovoltaic Specialists Conference, PVSC 2013 : Tampa, Florida, USA, 16.06.2013-21.06.2013
Piscataway, NJ: IEEE, 2013
ISBN: 978-1-4799-3299-3
pp.1566-1570
Photovoltaic Specialists Conference (PVSC) <39, 2013, Tampa/Fla.>
English
Conference Paper
Fraunhofer ISE ()
photovoltaisches Modul; Systeme und Zuverlässigkeit; Photovoltaische Module und Kraftwerke; Photovoltaische Module - Systeme und Zuverlässigkeit; Gebrauchsdauer von Modulen und Materialien; Gebrauchsdaueranalyse und Umweltsimulation

Abstract
The humidity is considered as an important degradation factor for PV-modules. The famous Damp/Heat test within the type approval testing according to IEC 61215 should take the moisture impact into account. We carried out damp/heat tests at different temperatures with different commercial crystalline Silicon PV-modules of the same basic design but with different materials and from different manufacturers. Taking the differences of time to failure and activation energies into account for service life models showed that adopted accelerated life tests would require very different stress levels according to the module properties.

: http://publica.fraunhofer.de/documents/N-283863.html