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Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities

 
: Hangmann, C.; Hedayat, C.; Hilleringmann, U.

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Circuits and Systems Society:
IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013 : 4-7 August 2013, Columbus, Ohio
Piscataway, NJ: IEEE, 2013
ISBN: 978-1-4799-0066-4
pp.309-312
International Midwest Symposium on Circuits and Systems (MWSCAS) <56, 2013, Columbus/Ohio>
English
Conference Paper
Fraunhofer ENAS ()

Abstract
The characterization of nonidealities in a CP-PLL is a challenge in modeling and simulation. In general the CP-PLL is implemented in a transistor-level simulation platform, including all nonidealities and parasitic effects. Due to the low-frequency and the high-frequency part of the CP-PLL, the simulation at transistor-level is time and computer resource consuming. Because of the triggered nature of the mixed-signal CP-PLL the event-driven model is an efficient modeling technique. In this paper an enhanced event-driven model is investigated, considering some typical nonidealities. This model allows an efficient analysis and characterization of the nonideality-effects. All results are validated by a transistor-level simulation.

: http://publica.fraunhofer.de/documents/N-279199.html