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Verfahren zur zerstörungsfreien quantitativen Bestimmung der Mikroeigenspannung II. und/oder III. Art

Method for non-destructive quantitative determination of the micro-tension II and/or III Type
 
: Altpeter, Iris; Rabung, Madalina; Szielasko, K.; Schmauder, S.; Binkele, P.

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Frontpage ()

DE 102012007062 A1: 20120403
German
Patent, Electronic Publication
Fraunhofer IZFP ()

Abstract
The method involves performing removal of the specimen to exclusive formation of coherent copper precipitates. The load voltage value is determined. The load voltage is dependence of the maximum Barkhausen noise amplitude for a test piece and a maximum cooling. The withdrawal of the specimen to the Ostwald ripening is performed. The load voltage value is determined. The load voltage is dependence of the maximum Barkhausen noise amplitude for a test piece after the removal to Ostwald ripening and cooling. The micro residual stress of the specimen is determined.

: http://publica.fraunhofer.de/documents/N-270991.html