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Title
Verfahren zur zerstörungsfreien quantitativen Bestimmung der Mikroeigenspannung II. und/oder III. Art
Date Issued
2012
Author(s)
Patent No
102012007062
Abstract
The method involves performing removal of the specimen to exclusive formation of coherent copper precipitates. The load voltage value is determined. The load voltage is dependence of the maximum Barkhausen noise amplitude for a test piece and a maximum cooling. The withdrawal of the specimen to the Ostwald ripening is performed. The load voltage value is determined. The load voltage is dependence of the maximum Barkhausen noise amplitude for a test piece after the removal to Ostwald ripening and cooling. The micro residual stress of the specimen is determined.
Language
de
Patenprio
DE 102012007062 A1: 20120403