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Data-driven methods for fault localization in process technology

: Kühnert, Christian

Fulltext urn:nbn:de:0072-364277 (6.1 MByte PDF)
MD5 Fingerprint: 730f861fc02b67d6fe2d0555e79417ef
Created on: 5.12.2013


Karlsruhe: KIT Scientific Publishing, 2013, XVII, 194 pp.
Zugl.: Karlsruhe, Inst. für Technologie (KIT), Diss., 2013
Karlsruher Schriften zur Anthropomatik, 15
ISBN: 978-3-7315-0098-8
Dissertation, Electronic Publication
Fraunhofer IOSB ()

Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant's devices the fault can lead to an alarm flood. This again hides the original location of the causing device. In this work several data-driven approaches for root cause localization are proposed, compared and combined. All methods analyze disturbed process data for backtracking the propagation path.