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  4. Individual source vias for GaN HEMT power bars
 
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2013
Conference Paper
Title

Individual source vias for GaN HEMT power bars

Abstract
In this paper the layout concept based on individual source vias (ISV) is introduced and investigated for GaN HEMT power bar transistors. The influence of the source inductance on the gain parameters as well as on the stability is shown. The layout concept is described and small-signal measurements confirm the improvement of the gain as compared to a microstrip transmission line (MSL) concept. Measurements on packaged power bars show the benefit of ISV layouts both in terms of stability point and gain as well as P(out) and PAE. Such measurements show PAE values of 70% in package and high gain values of 20.5 dB while delivering 106 W of output power at 2 GHz.
Author(s)
Musser, M.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Raay, Friedbert van  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Brueckner, Peter  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Bronner, Wolfgang  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Quay, Rüdiger  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mikulla, Michael  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
8th European Microwave Integrated Circuits Conference, EuMIC 2013. Proceedings  
Conference
European Microwave Integrated Circuits Conference (EuMIC) 2013  
European Microwave Week (EuMW) 2013  
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
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