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Nanoscale deformation analysis for fracture mechanical evaluation of interface cracks in electronic packages

 
: Keller, J.; Schulz, M.; Mrossko, R.; Wunderle, B.; Michel, B.

Laudon, M. ; Nano Science and Technology Institute -NSTI-:
NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012, Nanotech Conference & Expo 2012. Technical Proceedings. Vol.2:Nanotechnology 2012: Electronics, devices, fabrication, MEMS, fluidics and computational : An interdisciplinary integrative forum on nanotechnology, microtechnology, biotechnology and cleantechnology ; June 18 - 21, 2012, Santa Clara Convention Center, Santa Clara, California, U.S.A. ; NSTI Nanotech 2012 joint meeting ; the 15th annual NSTI Nanotechnology Conference and Expo is part of the TechConnect World Annual Conference & Expo
Boca Raton, Fla.: CRC Press, 2012
ISBN: 978-1-466-56275-2
ISBN: 978-1-4665-6287-5 (Set)
ISBN: 978-1-466-56278-3 (DVD)
pp.439-442
Nanotech Conference and Expo <15, 2012, Santa Clara/Calif.>
English
Conference Paper
Fraunhofer ENAS ()

Abstract
The ongoing development of highly integrated electronic packages leads to a steadily increasing number of material interfaces within a package. In combination with increasing harshness (vibration, humidity, temperature) of the system environment the reliability of such packages is often dominated by interface fracture. Therefore interface fracture mechanics is one of the main focuses of electronics reliability research. The authors present a combined simulative and experimental method for crack tip location determination and crack evaluation of interface specimens. The specimens are loaded in a testing apparatus which is an advancement of a mixed mode bending test. Based on crack length measurements and Finite Element Analysis crititcal energy release rates can be axtracted in a fast and inexpensive method.

: http://publica.fraunhofer.de/documents/N-264082.html