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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Local deformation and stress analysis in the micro-nano interface regions

 
: Vogel, D.; Auerswald, E.; Dudek, R.; Auersperg, J.; Rzepka, S.; Michel, B.

International Microelectronics and Packaging Society -IMAPS-, Poland Chapter; Components, Packaging and Manufacturing Technology Society -CPMT-:
36th International Microelectronics and Packaging Conference 2012. Proceedings. CD-ROM : IMAPS-CPMT Poland Conference, Kolobrzeg, 26 - 29 September 2012
Kolobrzeg, 2012
International Microelectronics and Packaging Society, Poland Chapter (IMAPS Conference) <36, 2012, Kolobrzeg>
English
Conference Paper
Fraunhofer ENAS ()

: http://publica.fraunhofer.de/documents/N-256691.html