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Compositional sensitivity of microstructures and thermoelectric properties of Ag(1-x)Pb(18)Sb(1+y)Te(20) compounds

: Perlt, S.; Höche, T.; Dadda, J.; Müller, E.; Rauschenbach, B.


Journal of Electronic Materials 42 (2013), No.7, pp.1422-1428
ISSN: 0361-5235
ISSN: 1543-186X
Journal Article
Fraunhofer IWM ( IMWS) ()

This study reports microstructural investigations of Ag1-x Pb18Sb1+y Te20, i.e., Ag-deficient and Sb-excess lead-antimony-silver-tellurium-18 (LAST-18: x 0, y 0). Two different length scales are explored. The micrometer scale was evaluated by scanning electron microscopy (SEM) to analyze the number of secondary phases as well as composition. Site-specific focused ion-beam liftout of transmission electron microscopy (TEM) lamellae from thermoelectrically characterized samples was accomplished to investigate the structure on the nanometer scale. TEM was performed to reveal the shape and orientation relationship of nanoprecipitates. The study is completed with results for the thermoelectric properties for different values of x and y.