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Combined characterization techniques to understand the stability of a variety of organic photovoltaic devices - The ISOS-3 interlaboratory collaboration

: Lira-Cantu, M.; Tanenbaum, D.M.; Norrman, K.; Voroshazi, E.; Hermenau, M.; Lloyd, M.T.; Teran-Escobar, G.; Galagan, Y.; Zimmermann, B.; Hösel, M.; Dam, H.F.; Jørgensen, M.; Gevorgyan, S.; Lutsen, L.; Vanderzande, D.; Hoppe, H.; Rösch, R.; Würfel, U.; Andriessen, R.; Rivaton, A.; Uzunoglu, G.Y.; Germack, D.; Andreasen, B.; Madsen, M.V.; Bundgaard, E.; Krebs, F.C.


Dhere, N.G. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Reliability of photovoltaic cells, modules, components, and systems V : 13 - 16 August 2012, San Diego, California, United States
Bellingham, WA: SPIE, 2012 (Proceedings of SPIE 8472)
ISBN: 978-0-8194-9189-3
Paper 847203
Conference "Reliability of Photovoltaic Cells, Modules, Components, and Systems" <5, 2012, San Diego/Calif.>
Conference Paper
Fraunhofer ISE ()

This work is part of the inter-laboratory collaboration to study the stability of seven distinct sets of state-of-the-art organic photovoltaic (OPVs) devices prepared by leading research laboratories. All devices have been shipped to and degraded at the Danish Technical University (DTU, formerly RISO-DTU) up to 1830 hours in accordance with established ISOS-3 protocols under defined illumination conditions. In this work we present a summary of the degradation response observed for the NREL sample, an inverted OPV of the type ITO/ZnO/P3HT:PCBM/PEDOT:PSS/Ag/Al, under full sun stability test. The results reported from the combination of the different characterization techniques results in a proposed degradation mechanism. The final conclusion is that the failure of the photovoltaic response of the device with time under full sun solar simulation, is mainly due to the degradation of the electrodes and not to the active materials of the solar cell.