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All-contactless measurement of series resistance distributions on solar cells with photoluminescence imaging

 
: Kasemann, M.; Reindl, L.M.; Michl, B.; Warta, W.; Schütt, A.; Carstensen, J.

ASM International; Electronic Device Failure Analysis Society -EDFAS-, Materials Park/Ohio:
ISTFA 2011, 37th International Symposium for Testing and Failure Analysis. Conference Proceedings : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA
Materials Park, Ohio: ASM International, 2011
ISBN: 0-615-03826-3
ISBN: 978-1-615-03826-8 (Print)
ISBN: 978-1-615-03850-3 (eBook)
ISBN: 978-1-615-03833-6
pp.340-344
International Symposium for Testing and Failure Analysis (ISTFA) <37, 2011, San Jose/Calif.>
English
Conference Paper
Fraunhofer ISE ()

Abstract
Conventional series resistance imaging methods require electrical contacts for current injection or extraction in order to generate lateral current flow in the solar cell. This paper presents a new method to generate lateral current flow in the solar cell without any electrical contacts. This reduces the sample handling complexity for inline application and allows for measurements on unfinished solar cell precursors.

: http://publica.fraunhofer.de/documents/N-253980.html