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  4. Extending the power cycling lifetime of SiC diodes (by increased cooling temperatures)
 
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2013
Presentation
Title

Extending the power cycling lifetime of SiC diodes (by increased cooling temperatures)

Title Supplement
Presentation held at ISiCPEAW 2013, 09.06. - 11.06.2013, Stockholm, Sweden
Other Title
Verbesserung der Lastwechselfestigkeit von SiC Dioden durch erhöhte Kühlmitteltemperaturen
Abstract
SiC devices can easily deal with higher temperatures(if the electrical performance of unipolar devices is excluded). Increased cooling temperature can extend the lifetime. Temperature swing and cooling temperature have to be separately considered. A temperature dependent material characterization is needed. Empirical lifetime models can only be applied for the kind of assemblies and test condition that they were meant for. SiC devices with the sintering technology have a huge potential. The temperature of their applications can be significantly increased. But silver-sintering is only one part of a power module. High temperature behavior of molding, housing, terminals, sensors, insulating material and their electrical, thermal, mechanical interconnections have also be considered.
Author(s)
Hutzler, Aaron
Schletz, Andreas  
Tokarski, Adam
Conference
International SiC Power Electronics Applications Workshop (ISiCPEAW) 2013  
DOI
10.24406/publica-fhg-380162
File(s)
001.pdf (1.73 MB)
Rights
Under Copyright
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • silicon-carbide devices

  • diode

  • active power cycling

  • lifetime

  • packaging

  • power electronics

  • increased cooling temperatures

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