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Astigmatism and beam quality of high-brightness tapered diode lasers

Astigmatismus und Strahlqualität von Trapezlasern hoher Brillanz
 
: Kelemen, M.T.; Weber, J.; Kallenbach, S.; Pfahler, C.; Mikulla, M.; Weimann, G.

:

Lenstra, D. ; European Optical Society -EOS-; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Semiconductor lasers and laser dynamics : 27 - 30 April 2004, Strasbourg, France
Bellingham/Wash.: SPIE, 2004 (SPIE Proceedings Series 5452)
ISBN: 0-8194-5375-7
pp.233-243
Conference Semiconductor Lasers and Laser Dynamics <2004, Strasbourg>
English
Conference Paper
Fraunhofer IAF ()
high brightness; hohe Brillanz; diode laser; Diodenlaser; high-power diode laser; Hochleistungs-Diodenlaser; tapered laser; Trapezlaser; astigmatism; Astigmatismus; beam quality; Strahlqualität

Abstract
Semiconductor lasers with high beam quality and high optical output power are very attractive for a variety of applications such as molecular spectroscopy, fiber optic communication and frequency conversion. In the used power regime, devices based on tapered gain sections are the most promising candidates to reach these demands. However, two disadvantages of the tapered laser concept are the reduced output power provoked by their additional resonator losses and the astigmatism of these diode lasers. In case of high brightness diode lasers it is important to discuss the methods needed for an advanced output power also from the point of view of beam quality. The knowledge about astigmatism is essential for designing micro-optics.
For the experimental results low modal gain, single quantum well InGaAs/AlGaAs devices emitting at 980 nm were grown by molecular beam epitaxy. The influence of the thermal resistance and of the tapered section length on the output power as well as on the beam quality has been investigated. In addition the impact of these parameters on the astigmatism of tapered diode lasers has been analysed. The experimental results have been correlated with simulations of the current-power curves and BPM simulations of the nearfield behaviour.

: http://publica.fraunhofer.de/documents/N-24384.html