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2013
Journal Article
Titel
Resolution and sensitivity of wafer-level multi-aperture cameras
Abstract
The scaling limits of multi-aperture systems have been widely discussed from an information-theoretical standpoint. While these arguments are valid as an upper limit, the real-world performance of systems for mobile devices remains restricted by optical aberrations. We argue that aberrations can be more easily controlled with certain architectures of multi-aperture systems, especially those manufactured on wafer scale (wafer-level optics, WLO). We complement our analysis with measurements of one single- and one multi-aperture WLO camera. We examine both sharpness and sensitivity, giving measurements of modulation transfer function and temporal noise, and showing that multi-aperture systems can indeed reduce size without compromising performance.