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Fully implanted n-type PERT solar cells

 
: Benick, J.; Müller, R.; Bateman, N.; Hermle, M.

:
Fulltext urn:nbn:de:0011-n-2364782 (286 KByte PDF)
MD5 Fingerprint: 5ff2b117aa9aa8094ee0ca06cdff5351
Created on: 13.4.2013


Nowak, S. ; European Commission:
27th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2012. DVD-ROM : Proceedings of the international conference held in Frankfurt, Germany, 24 - 28 September 2012
München: WIP-Renewable Energies, 2012
ISBN: 3-936338-28-0
pp.676-679
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <27, 2012, Frankfurt>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()
Solarzellen - Entwicklung und Charakterisierung; Silicium-Photovoltaik; Dotierung und Diffusion; Herstellung und Analyse von hocheffizienten Solarzellen; Industrielle und neuartige Solarzellenstrukturen

Abstract
Ion implantation is the technique of choice for introducing dopant species into semiconductors in CMOS devices. In photovoltaics ion implantation could be an interesting alternative to tube furnace diffusion processes. In this work we thus show that the damage introduced during implantation can be completely removed during annealing and that a co-annealing process can be applied for the annealing of boron and phosphorus profiles. Boron emitter implanted PassDop as well as fully implanted PERT solar cells have been fabricated. High conversion efficiencies could be achieved for both, the PassDop (22.2%, 694 mV) as well as for the fully implanted PERT (22.3%, 684 mV) solar cells, proving the high quality of the applied boron and phosphorus implantation.

: http://publica.fraunhofer.de/documents/N-236478.html