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Optimizing micro raman and PL spectroscopy for solar cell technological assessment

: Heinz, F.D.; Warta, W.; Schubert, M.C.

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Energy Procedia 27 (2012), pp.208-213
ISSN: 1876-6102
International Conference on Crystalline Silicon Photovoltaics (SiliconPV) <2, 2012, Leuven>
Journal Article, Conference Paper, Electronic Publication
Fraunhofer ISE ()
Solarzellen - Entwicklung und Charakterisierung; Silicium-Photovoltaik; Charakterisierung von Prozess- und Silicium-Materialien; Herstellung und Analyse von hocheffizienten Solarzellen; Messtechnik und Produktionskontrolle; Charakterisierung; Zellen und Module; Photoluminescence; Raman; Resolution

Significant improvements in the experimental setup of Micro-Raman (mu RS) and Micro-Photoluminescence-Spectroscopy (mu PL) for solar cell characterization are reported. The lateral resolution of doping density mapping with mu RS is improved to below 200 nm. A highly resolved measurement on an aluminum BSF demonstrates the increase in resolution. Furthermore, the characterization of thin silicon layers within the same experimental setup is presented. An excitation source with low penetration depth is used to screen out background signal from the substrate. Finally, a surface topography mapping technique is implemented to extend mu RS and mu PL to uneven surfaces. With this extension micro cracks in conventionally textured silicon solar cells could be successfully characterized.