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PLD of perovskite coatings for optoelectronics, microelectronics, and microtechnology

 
: Kreutz, E.W.; Gottmann, J.

:

Bartolomeo, E. di:
ELECTROCERAMICS VIII'02 : Rome, Italy, 25 - 28 August 2002. Refereed reports. Presented at the 8th International Conference on Electronic Ceramics and their Applications
Amsterdam: Elsevier, 2004 (Journal of the European Ceramic Society 24.2004,6)
pp.979-984
International Conference on Electronic Ceramics and their Applications (ELECTROCERAMICS) <8, 2002, Roma>
English
Conference Paper, Journal Article
Fraunhofer ILT ()
BaTiO3; crystalline orientation; ferroelectric property; film; pulsed laser deposition; x-ray methods

Abstract
The deposition of BaTiO3 thin films by pulsed excimer laser radiation (248 nm) on Pt/Ti/Si(111) and Pt/Ti/Si(100) substrates is investigated as a function of the processing variables laser fluence, processing gas pressure and target-to-substrate distance. The influence of the kinetic energy of the film-forming particles on the crystalline structure, defects and orientation and on the resulting electrical properties of the films is investigated. X-ray diffraction measurements and polarisation-dependent micro Raman measurements reveal a c-axis orientation normal to the substrate surface, in the case of high particle energy (> 50 eV), while at low kinetic energies (< 30 eV) a [111]pc or [110]pc orientation is preferred. The ferroelectricity and the dielectric constant of the films, determined by impedance measurements, decrease with increasing kinetic energy of the film-forming particles from Epsilon r = 1000-2200 to Epsilon r = 200-700. This decrease correlates with the change of the orientation and with an increasing lattice constant of the films, indicating that particles with high kinetic energies produce crystal defects and stress in the growing film.

: http://publica.fraunhofer.de/documents/N-23436.html