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  4. Terahertz thin film and refractive index sensing with a metamaterial near-field sensor
 
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2012
Conference Paper
Title

Terahertz thin film and refractive index sensing with a metamaterial near-field sensor

Abstract
We present a metamaterial-based sensor for use at terahertz (THz) frequencies that is suitable for the measurement of the thickness and the refractive index of a dielectric sample material. The sensor is designed to operate in reflection geometry in the frequency range between 1 THz and 1.6 THz. Deep-subwavelength sample thicknesses as small as 1/16000 of the operating wavelength can be resolved as well as refractive index differences of 0.01.
Author(s)
Schmitt, Klemens
Wollrab, Viktoria
Neu, Jens
Beigang, René
Rahm, Marco
Mainwork
37th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2012  
Conference
International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) 2012  
DOI
10.1109/IRMMW-THz.2012.6379516
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • liquid

  • metamaterial

  • refractive index measurement

  • resonant frequency

  • silicon

  • substrate

  • terahertz wave detector

  • thin film sensor

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