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Terahertz thin film and refractive index sensing with a metamaterial near-field sensor

 
: Schmitt, Klemens; Wollrab, Viktoria; Neu, Jens; Beigang, René; Rahm, Marco

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Institute of Electrical and Electronics Engineers -IEEE-:
37th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2012 : University of Wollongong, Australia, September 23 - 28, 2012
Piscataway/NJ: IEEE, 2012
ISBN: 978-1-4673-1598-2 (Print)
ISBN: 978-1-4673-1596-8 (Online)
ISBN: 978-1-4673-1597-5
2 pp.
International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) <37, 2012, Wollongong/Australia>
English
Conference Paper
Fraunhofer IPM ()
liquid; metamaterial; refractive index measurement; resonant frequency; silicon; substrate; terahertz wave detector; thin film sensor

Abstract
We present a metamaterial-based sensor for use at terahertz (THz) frequencies that is suitable for the measurement of the thickness and the refractive index of a dielectric sample material. The sensor is designed to operate in reflection geometry in the frequency range between 1 THz and 1.6 THz. Deep-subwavelength sample thicknesses as small as 1/16000 of the operating wavelength can be resolved as well as refractive index differences of 0.01.

: http://publica.fraunhofer.de/documents/N-233023.html