Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Terahertz thin film and refractive index sensing with a metamaterial near-field sensor
| Institute of Electrical and Electronics Engineers -IEEE-:
37th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2012 : University of Wollongong, Australia, September 23 - 28, 2012
Piscataway/NJ: IEEE, 2012
ISBN: 978-1-4673-1598-2 (Print)
ISBN: 978-1-4673-1596-8 (Online)
ISBN: 978-1-4673-1597-5
2 pp. |
| International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) <37, 2012, Wollongong/Australia> |
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| English |
| Conference Paper |
| Fraunhofer IPM () |
| liquid; metamaterial; refractive index measurement; resonant frequency; silicon; substrate; terahertz wave detector; thin film sensor |
Abstract
We present a metamaterial-based sensor for use at terahertz (THz) frequencies that is suitable for the measurement of the thickness and the refractive index of a dielectric sample material. The sensor is designed to operate in reflection geometry in the frequency range between 1 THz and 1.6 THz. Deep-subwavelength sample thicknesses as small as 1/16000 of the operating wavelength can be resolved as well as refractive index differences of 0.01.