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Measurement uncertainties in thermoelectric materials

 
: Jacquot, Alexandre; Pernau, Hans-Fridtjof; König, Jan; Nussel, Ulrike; Bartel, Markus; Ebling, Dirk; Jägle, Martin

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Fulltext ()

ECT 2010. Online proceedings
Online im WWW, 2010
http://docs.google.com/folder/d/0Bzub7mUI8XF3NjcyNWFiM2MtODQzMC00YmZhLWJlMTMtYTcwM2QxMjBhZjQx/edit?num=50&sort=name&layout=grid&pli=1
P1-10, 5 pp.
European Conference on Thermoelectrics (ECT) <8, 2010, Como>
English
Conference Paper, Electronic Publication
Fraunhofer IPM ()
3Omega; 2Omega; IPM-SR; IPM-S-screening; measurement system; thermoelectric; power factor; Seebeck coefficient; van der Pauw; hall; thermal conductivity; thin film; ZT-meter

: http://publica.fraunhofer.de/documents/N-233003.html