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Influence of film thicknesses on the electrical properties of RuO2-thick film resistors on aluminium nitride ceramics (AlN)
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2012
Conference Paper
Titel
Influence of film thicknesses on the electrical properties of RuO2-thick film resistors on aluminium nitride ceramics (AlN)
Author(s)
Schmidt, R.
Kretzschmar, C.
Eberstein, M.
Hauptwerk
IMAPS 2011, 44th International Symposium on Microelectronics. Proceedings. Vol.1
Konferenz
International Symposium on Microelectronics (IMAPS) 2011
Language
English
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Fraunhofer-Institut für Keramische Technologien und Systeme IKTS