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Pattern innovation for architecture diagnostics in services computing

: Zimmermann, Alfred; Reiners, René

International Academy, Research, and Industry Association -IARIA-:
PATTERNS 2012, Fourth International Conferences on Pervasive Patterns and Applications : July 22-27, 2012, Nice, France
Nice, 2012
ISBN: 978-1-61208-221-9
International Conferences on Pervasive Patterns and Applications (PATTERNS) <4, 2012, Nice>
Conference Paper
Fraunhofer FIT ()
service-oriented system; architecture maturity framework; assessment patterns; pattern evolution

Assessing the maturity of service-oriented enterprise software architectures is a problem since the current practice has been developed rather intuitively providing only a sparse and rarely validated metamodel. In preliminary research, we have developed an original pattern language for supporting repetitive enterprise system architecture assessment. The aim is the evaluation and optimization of these kinds of architectures. For this purpose, we extended base frameworks like the Capability Maturity Model Integration and The Open Group Architecture Framework. Since we apply a pattern catalogue for the assessment of enterprise system architectures, we see ourselves confronted with the problem that patterns are traditionally derived after long experience by an expert group of pattern authors. In our view, this may lead to a decelerated reuse of available knowledge. Our approach intends to integrate available knowledge from services computing and software architects directly from the beginning of the pattern development process. Over time, these ideas are iteratively developed towards validated patterns by feeding back the insights of pattern applications. This allows the early integration of new findings and concepts into the pattern catalogue at an early stage whereas already existing patterns are continuously refined. In this work, we propose both, a clear maturity framework background for the developed assessment patterns, and an early integration of new ideas as pattern candidates within a pattern evolution process.