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Optical Characterisation of Random Pyramid Texturization

 
: Birmann, K.; Demant, M.; Rein, S.

:
Fulltext urn:nbn:de:0011-n-2210745 (370 KByte PDF)
MD5 Fingerprint: c3f52f47a43be61728333b6cb4c76a2d
Created on: 7.12.2012


European Commission:
26th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC. Proceedings : 5th to 9th September 2011 at the CCH - Congress Centre and International Fair Hamburg in Germany
München: WIP-Renewable Energies, 2011
ISBN: 3-936338-27-2
pp.1454-1458
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <26, 2011, Hamburg>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()
PV Produktionstechnologie und Qualitätssicherung; Silicium-Photovoltaik; Produktionsanlagen und Prozessentwicklung

Abstract
The reflection property of alkaline textured wafers is an important parameter for texture evaluation. Nevertheless, the geometric properties of the surface structure influence cell performance and cannot be distinguished by reflection measurements only. The pyramid size distribution can affect, e.g. contact formation or emitter passivation. Confocal images allow the recognition of shiny areas, the pyramid number and pyramid size distribution. The laser intensity and height information images were evaluated by image processing techniques. The pyramid segments of the pyramids were found to be a good indicator for peak size and recognition of long pyramid edges. The derived pyramid height distribution can be used to distinguish different pyramid homogeneity.

: http://publica.fraunhofer.de/documents/N-221074.html