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2011
Conference Paper
Titel
Grain Size Distribution of Multicrystalline Silicon for Structure Characterisation of Silicon Wafers
Abstract
Multicrystalline silicon has a share of approximately 50% in photovoltaic energy conversion. The multicrystalline structure of silicon has an influence on the efficiency of solar cells produced with this material. The aim of the present work is to summarize and evaluate different methods to characterize grain size distribution of multicrystalline silicon. The most common methods, the intercept and planimetric methods used in metallography are investigated. As a result of this investigation the circular intercept method is suggested as preferred method. For application of the preferred method a multicrystalline silicon block was crystallized and characterized at the SIMTEC laboratory of Fraunhofer ISE. Intercept length as a measure for grain size distribution was measured at several positions within this multicrystalline silicon block.