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Accessing OLED emitter properties by radiation pattern analysis

 
: Danz, Norbert; Flämmich, Michael; Michaelis, Dirk; Schmidt, Tobias; Brütting, Wolfgang

Ruhstaller, B. (Ed.):
International Conference on Simulation of Organic Electronics and Photovoltaics, SimOEP 2012. Book of Abstracts : Oliva, Valencia, Spain, 10th to 14th June 2012
Castelló, 2012 (Nanoenergy Symposia 10)
ISBN: 978-84-940189-1-6
pp.49
International Conference on Simulation of Organic Electronics and Photovoltaics (SimOEP) <2012, Oliva>
English
Abstract
Fraunhofer IOF ()

: http://publica.fraunhofer.de/documents/N-219931.html