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In-line thin film characterization using eddy current techniques
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2011
Conference Paper
Titel
In-line thin film characterization using eddy current techniques
Author(s)
Hillmann, S.
Klein, M.
Heuer, H.
Hauptwerk
Electromagnetic nondestructive evaluation XIV
Konferenz
International Workshop on Electromagnetic Nondestructive Evaluation (ENDE) 2010
DOI
10.3233/978-1-60750-750-5-330
Language
English
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