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Domain dependant matching of MES knowledge and domain independent mapping of AutomationML models

 
: Schleipen, Miriam; Gutting, Dirk; Sauerwein, Franziska

:
Postprint urn:nbn:de:0011-n-2196218 (228 KByte PDF)
MD5 Fingerprint: d69980fc654dd20cf80a2db3afe0bafa
© 2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Created on: 22.11.2012


University of Science and Technology, Krakow; IEEE Industrial Electronics Society:
17th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2012. Proceedings. Vol.1 : Krakow, Poland, 17 - 21 September 2012
New York, NY: IEEE, 2012
ISBN: 978-1-4673-4735-8 (Print)
ISBN: 978-1-4673-4736-5 (Online)
ISBN: 978-1-4673-4737-2
pp.361-367
International Conference on Emerging Technologies and Factory Automation (ETFA) <17, 2012, Kraków>
English
Conference Paper, Electronic Publication
Fraunhofer IOSB ()

Abstract
Knowledge is one of the most valuable goods within production planning. It can be divided into domain dependant knowledge and domain independent knowledge. An example for domain dependant knowledge is Manufacturing Execution System (MES) specific knowledge. An example for domain independent knowledge is the XML-based data exchange format AutomationML. Both types of knowledge are necessary. This contribution shows the application of ontology mapping and matching methods in the context of domain dependant and domain independent knowledge to support the engineer in working with the data and improve the usage of such information processing.

: http://publica.fraunhofer.de/documents/N-219621.html