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High throughput manufacturing process of probes for sub-50nm scanning thermal microscopy

Poster at ICN+T 2007, International Conference on Nano Science and Technology 2007, 02.-06.07.2007, Stockholm, Sweden
 
: Richter, C.; Engl, W.; Weinzierl, P.; Sulzbach, T.; Beuer, S.; Petersen, S.; Stockmeyer, J.; Rommel, M.

:
Poster urn:nbn:de:0011-n-2124629 (520 KByte PDF)
MD5 Fingerprint: 0205a48798e2ca390f3eb988afbf5c78
Created on: 4.9.2012


2007, 1 Folie
International Conference on Nano Science and Technology (ICN+T) <2007, Stockholm>
English
Poster, Electronic Publication
Fraunhofer IISB ()
scanning thermal microscopy; Schottky probes; thermocouple probes

: http://publica.fraunhofer.de/documents/N-212462.html