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Detailed study on the passivation mechanism of a-SixC1-x for the solar cell rear side

 
: Suwito, D.; Roth, T.; Pysch, D.; Korte, L.; Richter, A.; Janz, S.; Glunz, S.W.

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Fulltext urn:nbn:de:0011-n-2099141 (430 KByte PDF)
MD5 Fingerprint: 967eb6a21973b19c661ae61c0befd0f9
Created on: 1.9.2012


Lincot, D. ; European Commission, Joint Research Centre -JRC-:
The compiled state-of-the-art of PV solar technology and deployment. 23rd European Photovoltaic Solar Energy Conference, EU PVSEC 2008. Proceedings. CD-ROM : Held in Valencia, Spain, 1 - 5 September 2008; Proceedings of the international conference
München: WIP-Renewable Energies, 2008
ISBN: 3-936338-24-8
ISBN: 978-3-936338-24-9
pp.1023-1028
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <23, 2008, Valencia>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()

Abstract
In this work we focus on the surface passivation of p-FZ, 1 ohm cm silicon wafers by intrinsic, silicon-rich, amorphous silicon carbide (a-SixC1-x:H) with excellent passivation quality (Seff < 5 cms-1 for p- and n-type 1 ohm cm silicon at n=5·1014 cm-3). For the purpose of extracting the effective surface recombination velocity (Seff) independent of the bulk properties, we use a set of identically passivated wafers of different substrate thickness (W). The injection-dependent carrier lifetime eff(n) is determined in a wide injection level range (1010-1017 cm-3) using a combination of the quasi-steady-state photoconductance (QSS-PC) and photoluminescence (QSS-PL) technique. Seff is extracted by evaluation of the slope of the 1/eff vs. 1/W plot for each injection level without any additional assumptions on the bulk lifetime. These pure Seff data obtained in such a way is then used within the simple Shockley-Read-Hall (SRH) model to extract surface parameters such as the interface charge density Qf. Surface photovoltage measurements (SPV) performed on the a-SiC/c-Si system confirm an amphoteric behaviour of the interface charge. Our study shows that the low-injection lifetime data determined by QSS-PL plays a crucial role for the accurate modelling of surface parameters.

: http://publica.fraunhofer.de/documents/N-209914.html