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Application of luminescence imaging based series resistance measurement methods in an industrial environment

 
: Michl, B.; Kasemann, M.; Giesecke, J.; Glatthaar, M.; Schütt, A.; Carstensen, J.; Föll, H.; Rein, S.; Warta, W.; Nagel, H.

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Fulltext urn:nbn:de:0011-n-2097381 (534 KByte PDF)
MD5 Fingerprint: 120dd65cd147e39f183a8d220d0cc068
Created on: 1.9.2012


Lincot, D. ; European Commission, Joint Research Centre -JRC-:
The compiled state-of-the-art of PV solar technology and deployment. 23rd European Photovoltaic Solar Energy Conference, EU PVSEC 2008. Proceedings. CD-ROM : Held in Valencia, Spain, 1 - 5 September 2008; Proceedings of the international conference
München: WIP-Renewable Energies, 2008
ISBN: 3-936338-24-8
ISBN: 978-3-936338-24-9
pp.1176-1181
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <23, 2008, Valencia>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()

Abstract
In this work the applicability of the recently proposed luminescence based series resistance measurement methods on typical cell processing problems in industry is investigated. The experimentally determined values of different methods are compared on mono- and multicrystalline cells. The method RsPL based on PL imaging shows the best results on multi material. In a second step it is tested whether the Rs values obtained with RsPL allow quantitative conclusions about the influence of high local series resistances on solar cell efficiency. Therefore a new procedure based on a simple network model is introduced to calculate global values from the Rs images. The values obtained with this procedure show only a slightly different correlation to the fill factor than it is theoretically expected. Finally, it is concluded from investigations of the impact of reduced measurement times that an inline measurement with quantitative reliable results is possible with data acquisition times of <1s.

: http://publica.fraunhofer.de/documents/N-209738.html