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Analytical solution for charge carrier transients in a two-layer-structure

 
: Henninger, V.; Warta, W.

:
Fulltext urn:nbn:de:0011-n-2096112 (830 KByte PDF)
MD5 Fingerprint: 116521531f50953cac83b50d9be5a4e4
Created on: 9.11.2012


Ossenbrink, H.A.:
Fourteenth European Photovoltaic Solar Energy Conference 1997. Proceedings. Vol.2 : International conference held at Barcelona, Spain, 30 June-4 July 1997
Bedford: Stephens, 1997
ISBN: 1-901675-03-5
ISBN: 1-901675-01-9
ISBN: 1-901675-02-7
pp.2408-2411
European Photovoltaic Solar Energy Conference <14, 1997, Barcelona>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()

Abstract
The use of photo-conductance decay measurements for determining charge carrier lifetimes in a two-layer structure was up to now limited by the lack of an appropriate analytical solution describing the carrier dynamics. We present an exact solution for arbitrary layer parameters. We prove that in the limit that the lifetime in layer 1 is much higher than in layer 2 the exact solution reduces to the standard approximation with an effective recombination velocity for layer 2. Plots for the deviation of the approximate from the exact solution for wide parameter ranges are presented. Furthermore, we describe a sensitive test for contamination in deposition equipment.

: http://publica.fraunhofer.de/documents/N-209611.html