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Evaluation of the accelerated life testing conditions for PV-modules based on measured and simulated weathering stress

 
: Koehl, M.; Heck, M.; Wiesmeier, S.

:

IEEE Electron Devices Society:
37th IEEE Photovoltaic Specialists Conference, PVSC 2011 : 19-24 June 2011, Seattle, WA, USA
Piscataway: IEEE, 2011
ISBN: 978-1-4244-9966-3
ISBN: 978-1-4244-9965-6 (print)
pp.3166-3169
Photovoltaic Specialists Conference (PVSC) <37, 2011, Seattle/Wash.>
English
Conference Paper
Fraunhofer ISE ()

Abstract
The development of novel cost-reducing components for PV-modules requires accelerated service life testing procedures for their qualification. A methodology was developed, which can facilitate the estimation of the durability of PV-modules at locations with available climatic data.

: http://publica.fraunhofer.de/documents/N-208894.html