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Highly precise parameter extraction of thin multi-layers in THz transmission and reflection geometry

 
: Brahm, A.; Weigel, A.; Riehemann, S.; Notni, G.; Tünnermann, A.

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IEEE Microwave Theory and Techniques Society:
36th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2011 : Houston, Texas, USA, 2 - 7 October 2011
Piscataway/NJ: IEEE, 2011
ISBN: 978-1-4577-0510-6 (Print)
ISBN: 978-1-4577-0508-3 (Online)
ISBN: 978-1-4577-0509-0
Art. 6104869
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <36, 2011, Houston/Tex.>
English
Conference Paper
Fraunhofer IOF ()
Fraunhofer IAP ()

Abstract
We present an algorithm operating in THz time-domain that enables us to determine unknown optical parameters of multi-layer systems. We investigated the algorithm with different multi-layer samples measured in THz transmission and reflection.

: http://publica.fraunhofer.de/documents/N-208858.html