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Lifetime analysis of photoconductive THz emitters

 
: Gobel, T.; Schoenherr, D.; Sydlo, C.; Feiginov, M.; Meissner, P.; Hartnagel, H.L.

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IEEE Microwave Theory and Techniques Society:
36th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2011 : Houston, Texas, USA, 2 - 7 October 2011
Piscataway/NJ: IEEE, 2011
ISBN: 978-1-4577-0510-6 (Print)
ISBN: 978-1-4577-0508-3 (Online)
ISBN: 978-1-4577-0509-0
Art. 6104776
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <36, 2011, Houston/Tex.>
English
Conference Paper
Fraunhofer HHI ()

Abstract
The durability of photoconductive Terahertz emitters significantly depends on bias voltage and/or optical power. We analyze the optimum operation conditions of photomixers for long-term performance and link the accessible signal-to-noise ratio to the photomixer lifetime via an Arrhenius analysis.

: http://publica.fraunhofer.de/documents/N-208716.html