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The development of a compact millimeter wave scanning system

: Krebs, C.; Warok, P.; Heinen, S.; Brauns, R.; Hommes, A.; Kose, S.; Teichrib, W.; Gütgemann, S.; Nüßler, D.


IEEE Microwave Theory and Techniques Society:
36th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2011 : Houston, Texas, USA, 2 - 7 October 2011
Piscataway/NJ: IEEE, 2011
ISBN: 978-1-4577-0510-6 (Print)
ISBN: 978-1-4577-0508-3 (Online)
ISBN: 978-1-4577-0509-0
Art. 6105003
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <36, 2011, Houston/Tex.>
Conference Paper
Fraunhofer FHR ()

The following paper describes the development of an autonomous and compact millimeter wave scanning measurement system (SAMMI - Stand Alone Millimeter wave Imager) which works in the W-Band (CW@78GHz). SAMMI® was developed to demonstrate the high potential and usability of the millimeter wave region for material classification[1].