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Fluorescence imaging for analysis of the degradation of PV-modules

 
: Roeder, B.; Schlothauer, J.; Koehl, M.

:

IEEE Electron Devices Society:
37th IEEE Photovoltaic Specialists Conference, PVSC 2011 : 19-24 June 2011, Seattle, WA, USA
Piscataway: IEEE, 2011
ISBN: 978-1-4244-9966-3
ISBN: 978-1-4244-9965-6 (print)
pp.003606-003608
Photovoltaic Specialists Conference (PVSC) <37, 2011, Seattle/Wash.>
English
Conference Paper
Fraunhofer ISE ()

Abstract
Fluorescence detection is presented as a tool for the investigation of EVA degradation that is used as encapsulant in PV-modules. The superior sensitivity of our set-up allows an early assessment of ageing processes in EVA already after 20h damp-heat exposure. A newly developed scanning system enables the laterally resolved inspection of entire PV modules. We also report the evaluation of outdoor weathered crystalline Si-modules demonstrating that besides ageing of EVA cracks of cells are well detectable, too.

: http://publica.fraunhofer.de/documents/N-208671.html