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Fabrication and application of shielded probes for conductive AFM measurements

Poster at Seeing at the Nanoscale 2012, 10th annual scientific conference, July 09th - 11th 2012, Bristol, UK
 
: Jambreck, Joachim D.; Rommel, Mathias; Richter, Christoph; Weinzierl, Philip; Bauer, Anton J.; Frey, Lothar

:
Poster urn:nbn:de:0011-n-2084178 (1.1 MByte PDF)
MD5 Fingerprint: 7a12e3ae47035ffea6634f35c4443ed8
Created on: 24.7.2012


2012, 1 Folie
Scientific Conference "Seeing at the Nanoscale" <10, 2012, Bristol>
English
Poster, Electronic Publication
Fraunhofer IISB ()
fabrication; application; shielded probes; conductive AFM; measurements; atomic force microscope; cAFM; TUNA; tunneling AFM

: http://publica.fraunhofer.de/documents/N-208417.html