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Comparative characterization of chip to epoxy interfaces by molecular modeling and contact angle determination

 
: Hölck, O.; Bauer, J.; Wittler, O.; Michel, B.; Wunderle, B.

:

Microelectronics reliability 52 (2012), No.7, pp.1285-1290
ISSN: 0026-2714
English
Journal Article
Fraunhofer IZM ()

Abstract
An investigation of interfacial interaction has been performed between three epoxy molding compound materials and a native silicon dioxide layer (SiO 2) usually found at chip surfaces. The epoxy materials were an industry oriented epoxy molding compound Epoxy Phenol Novolac (EPN), its filled variety EPN F (with silica particles) and a model aromatic epoxy 1 (2 1 2). All systems are described in full in [1] and [2]. The free surfaces of the solid materials were experimentally analyzed by contact angle measurements of three different liquids (water, methylene-iodide (MI) and glycerol). Results are compared to interfacial energies obtained by analysis of the interfaces in bimaterial molecular models, yielding reasonable agreement. A qualitative prediction regarding the influence of water on the interfacial strength between chip and molding compound is attempted.

: http://publica.fraunhofer.de/documents/N-206272.html