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Simulation method for LWIR radiation distribution using a visual ray-tracer

: Utz, Alexander; Gendrisch, Lutz; Weiler, Dirk; Kolnsberg, Stephan; Vogt, Holger


Optical and Quantum Electronics 44 (2012), No.3-5, pp.297-301
ISSN: 0306-8919
ISSN: 1572-817X
International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) <11, 2011, Rome>
Journal Article, Conference Paper
Fraunhofer IMS ()
infrared; Infrarot; ray tracing; Testsystem; test system; Simulation

Infrared camera with passive, uncooled sensor chips utilize the longwave-infrared (LWIR) range of the electromagnetic spectrum with wavelength between 8 and 14µm for image generation. The reason for this is that every object is self-luminous at room temperature at that wavelenght. Therefore, every surface acts as a source of radiation in an LWIR scenario. To gain an impression and to model the effects and circumstances in an infrared scenario, a simulation method is required. In the visual domain this task is accomplished by ray-tracing software, which allows the generation of synthetic images as well as the analysis of irradiance distribution in a given scene. In this paper we demonstrate a way to apply one of such ray-tracers to a LWIR scenario. We will also demonstrate an application of the proposed simulation method.