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Characterization procedures for nanorough ultrahydrophobic surfaces with controlled optical matter

 
: Flemming, M.; Reihs, K.; Duparre, A.

:

Duparre, A.; Singh, B. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3 - 5 August 2003, San Diego, California, USA
Bellingham/Wash.: SPIE, 2003 (SPIE Proceedings Series 5188)
ISBN: 0-8194-5061-8
pp.246-253
Conference on Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies <2003, San Diego/Calif.>
English
Conference Paper
Fraunhofer IOF ()
nanostructures; light scattering; optical appearance; visual inspection; roughness; thin film coating; nanostructure; light scattering; optical appearance

Abstract
Optical coatings with enhanced roughness offer promising prospects for ultra-hydrophobic transparent surfaces with controlled scatter losses. Our coating design approach is based on roughness characterization by power spectral density (PSD) functions as a tool to describe both the wetting behavior and scattering. For the design of architectural glass coatings, the definition of scatter thresholds is necessary. These thresholds can be determined from investigations that link visual inspection and total scatter (TS) measurements. Experiments with rough oxide layers yielded surfaces with a high water contact angle.

: http://publica.fraunhofer.de/documents/N-20528.html