Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Low noise, large area CMOS X-ray image sensor for C.T. application

: Kemna, A.; Brockherde, W.; Hosticka, B.J.; Özkan, E.; Morales-Serrano, F.; Steadman, R.; Vogtmeier, G.

DOI: 10.1109/ICSENS.2003.1279147

	Institute of Electrical and Electronics Engineers -IEEE-: IEEE Sensors 2003. Conference proceedings : Second IEEE International Conference on Sensors Piscataway, NJ: IEEE Operations Center, 2003 ISBN: 0-7803-8134-3 pp.1260-1265
	International Conference on Sensors <2, 2003, Toronto>

	English
	Conference Paper
	Fraunhofer IMS ()
	hohe Helligkeitsdynamik; geringes Rauschen; Röntgenstrahlung; image sensor; low noise; large-area detector; x-ray detector; CMOS-Sensor; Bildsensor; Lichtempfänger; Röntgentechnik; Computer-Tomographie

Abstract
In this paper, we describe a novel CMOS X-ray active pixel sensor for indirect C.T. X-ray detection. Considerable noise reduction has been achieved by lowering the detector junction capacitance. For this purpose a new low capacitance, low dark current dot type photodiode based on minority diffusion has been developed. The dynamic range is expanded to 17 bit by the use of individual in-pixel automatic gain control. A photon noise limited detector exhibiting a 20 x 10 pixel array with a frame rate of 3000 frames/sec has been realized in a 1.2µm CMOS process.

: http://publica.fraunhofer.de/documents/N-20064.html