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Estimation of permitivitty and loss tangent of high frequency materials in the millimeter wave band using a hemispherical open resonator

 
: Felbecker, R.; Keusgen, W.; Peter, M.

:

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE COMCAS 2011, 3rd International Conference on Microwaves, Communications, Antennas and Electronic Systems : Hilten Hotel, Tel Aviv, Israel, November 7-9, 2011
Piscataway/NJ: IEEE, 2011
ISBN: 978-1-4577-1692-8
ISBN: 1-4577-1692-5
International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMACS) <3, 2011, Tel Aviv>
English
Conference Paper
Fraunhofer HHI ()
frequency measurement; millimeter wave band; permittivity measurement; Q factor

Abstract
In this paper, a hemispherical open resonator is used to measure the quality factor and resonant frequency of various materials in the millimeter wave band. This measurement method allows us to determine the permittivity and the loss tangent of homogeneous materials. Materials like PTFE, PE and PS were used to validate the measurement system. Finally, we measured the resonant frequency and quality factor of samples of Rogers RO4003C and TMM10, which are up to now only characterized up to 10 GHz.

: http://publica.fraunhofer.de/documents/N-199928.html