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Inspection of Samples using a fast Millimetre Wave Scanner

: Hommes, A.; Nüssler, D.; Warok, P.; Krebs, C.; Heinen, S.; Essen, H.


Kyriacou, P.:
Sensors & their applications XVI : Cork, Ireland, 12 - 14 September 2011
Red Hook, NY: Curran, 2011 (Journal of physics. Conference series 307)
ISSN: 1742-6588
Art. 012033
Sensors and their Applications Conference <16, 2011, Cork>
Conference Paper
Fraunhofer FHR ()

Millimeterwaves and terahertz sensors can cover a broad field of applications ranging from production control to security scanners. The outstanding features are the transparency of many materials like textiles, paper and plastics in this frequency region, the good contrast of any humid or dense dielectric material and the capability to employ miniaturized RF systems and small antenna apertures or dielectric probes. A stand-alone-millimetre-wave-imager, SAMMY, was developed and built, to demonstrate the outstanding features of this part of the electromagnetic spectrum for material inspection.