Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Precisely assembled multi deflection arrays - key components for multi shaped beam lithography

 
: Mohaupt, Matthias; Beckert, Erik; Burkhardt, Thomas; Hornaff, Marcel; Damm, Christoph; Eberhardt, Ramona; Tünnermann, Andreas; Döring, Hans-Joachim; Reimer, Klaus

:

Ratchev, Svetan (Ed.); Westkämper, Engelbert (International Advisory Committee) ; International Federation for Information Processing -IFIP-, Working Group 5.5 Co-operation Infrastructure for Virtual Enterprises and Electronic Business:
Precision Assembly Technologies and Systems. 6th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2012 : Chamonix, France, February 12-15, 2012, Proceedings
Berlin: Springer, 2012 (IFIP advances in information and communication technology 371)
ISBN: 978-3-642-28162-4
ISBN: 3-642-28162-1
ISBN: 978-3-642-28163-1
DOI: 10.1007-978-3-642-28163-1
pp.42-50
International Precision Assembly Seminar (IPAS) <6, 2012, Chamonix>
English
Conference Paper
Fraunhofer IOF ()
multi-shaped beam lithography; multi deflection array; MEMS assembly, precision alignment

Abstract
Multi shaped beam lithography requires the precise and durable alignment and fixation of MEMS based Multi Deflection Arrays on stable ceramic system platforms using vacuum and high temperature compatible interconnection and joining technologies. Micron accuracy during assembly is accomplished by mark detection using image processing and 3DOF alignment procedures; while interconnection as well as precise fixation is carried out using a fine pitch solder bumping process. Qualification investigations using electron beam equipment show that the precisely aligned multi shaped beam arrays are able to deflect the electron beams in accordance with the simulation results.

: http://publica.fraunhofer.de/documents/N-195836.html