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Methods of parameter variations

 
: Knoth, Christoph; Schlichtmann, Ulf; Li, Bing; Zhang, Min; Olbrich, Markus; Acar, Emrah; Eichler, Uwe; Haase, Joachim; Lange, André; Pronath, Michael

:

Dietrich, Manfred (Ed.); Haase, Joachim (Ed.):
Process variations and probabilistic integrated circuit design
New York/NY: Springer Science+Business Media, 2012
ISBN: 978-1-4419-6620-9
ISBN: 1-4419-6620-X
ISBN: 978-1-4419-6621-6
DOI: 10.1007/978-1-4419-6621-6
pp.91-179
English
Book Article
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()

Abstract
Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.

: http://publica.fraunhofer.de/documents/N-195769.html