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Physical and mathematical fundamentals

 
: Lemaitre, Bernd; Sohrmann, Christoph; Muche, Lutz; Haase, Joachim

:

Dietrich, Manfred (Ed.); Haase, Joachim (Ed.):
Process variations and probabilistic integrated circuit design
New York/NY: Springer Science+Business Media, 2012
ISBN: 978-1-4419-6620-9
ISBN: 1-4419-6620-X
ISBN: 978-1-4419-6621-6
DOI: 10.1007/978-1-4419-6621-6
pp.11-67
English
Book Article
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()

Abstract
This chapter provides a short overview on the basics of CMOS transistor modeling with respect to deep submicron requirements and mathematical approaches to analyze variations in the design process. Technical terms are going to be defined and explained; physical processes and mathematical theories will be illustrated.

: http://publica.fraunhofer.de/documents/N-195728.html