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Detection and Avoidance of Contaminations on Solar Wafer and Cells

: Bürger, Frank; Wertz, Roland; Verl, Alexander


European Commission:
26th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC. Proceedings : 5th to 9th September 2011 at the CCH - Congress Centre and International Fair Hamburg in Germany
München: WIP-Renewable Energies, 2011
ISBN: 3-936338-27-2
2CV.2.44, pp. 2112-2113
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <26, 2011, Hamburg>
Conference Paper
Fraunhofer IPA ()
Contamination; Particle; Cleanroom; PV; Solar Cell; Reinraum; Fertigung; Kontamination; Solarzelle

In many different technical applications, especially in micro-manufacturing related business, the demand for higher yield and performance while keeping weight and energy consumption low increases constantly. The trend of miniaturized structures also can be seen in the photovoltaic industry and implicates the need for cleaner production environments. The effect of such fab conditions is the reduction of harming boundary conditions, having bad influence on the quality of production. Not only cleanrooms - production environments running with filtered and conditioned air – but also the contamination potential of process, handling equipment and cross contaminations between different processes are major aspects to be considered. Structures and functional layers in PV are presently, and in future, getting thinner. The negative influence of micro particles contaminating the substrates is consequently increasing. The work carried out at Fraunhofer IPA and shown in this paper depicts the methodology to identify the sources of contamination and the possibilities to minimize their potential of harming the overall value chain.