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2003
Conference Paper
Titel
Semi-analytical wave-field modeling applied to ultrasonic inspection simulation
Abstract
A semi-analytical approach is reviewed, which can applied to model ultrasound generation, propagation and scattering in complex-structured materials and components. The method is based on the superposition of point sources and allows to include all aspects relevant to testing simulation for such configurations as far as bulk wave propagation is concerned. Illustrative examples cover transducer modeling, the propagation of time-dependent rf-signals and the scattering of ultrasound at defects, addressing the simulation of ultrasonic inspection.
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