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Soft X-ray microscopic investigation on self assembling nanocrystals

 
: Benk, M.; Bergmann, K.; Querejeta-Fernández, A.; Srivastava, S.; Kotov, N.A.; Schaefer, D.; Wilhein, T.

:

McNulty, I. (Hrsg.):
10th International Conference on X-Ray Microscopy 2010 : Chicago, Illinois, (USA), 15 - 20 August 2010
Woodbury, N.Y.: AIP, 2011 (AIP Conference Proceedings 1365)
ISBN: 978-0-7354-0925-5
ISSN: 0094-243X
pp.433-436
International Conference on X-Ray Microscopy <10, 2010, Chicago/Ill.>
English
Conference Paper
Fraunhofer ILT ()

Abstract
Soft x-ray microscopy is well suited to investigation of nanoparticles in liquid media. Using a table-top microscope based on a gas-discharge source emitting at 2.88 nm, dried CdTe nanowires and dried PbS hyperbranched nanocrystals are investigated. These structures are the result of the assembly of nanoparticles in a liquid environment. Soft x-ray microscopy is aiming at a better understanding of underlying parameters that affect the self assembly to the desired final structures. It is shown that the presented setup is able to image these particles with a resolution of about 50 nm with exposure times in the range of tens of seconds. The discharge source has a photon flux of more than 109photons/(srsm2) at a photon energy of 430 eV with a bandwidth of /=840. The repetition rate of the source is up to 1000 Hz. With the current setup a photon flux of 5×10 6photons/(m2s) at the sample is achieved.

: http://publica.fraunhofer.de/documents/N-188476.html