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Overview of the 3rd international workshop on software patterns and quality (SPAQu'09)

 
: Washizaki, H.; Yoshioka, N.; Fernandez, E.B.; Jurjens, J.

:

Arora, S.; Leavens, G.T.:
Companion to the 24th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2009 : October 25-29, 2009, Orlando
New York: ACM, 2009
ISBN: 978-1-60558-768-4
pp.713-714
Annual ACM Conference on Object-Oriented Programming, Systems, Languages and Applications (OOPSLA) <24, 2009, Orlando>
English
Conference Paper
Fraunhofer ISST ()

Abstract
We will discuss here the theoretical, social, technological and practical issues related to quality aspects of software patterns including security and safety aspects. The workshop will provide the opportunity for bringing together researchers and practitioners, and for discussing the future prospects of this area. As for the workshop format, first, we will have short talks on what software patterns are, and how they are related to quality. Second, we will have accepted position paper presentations to expose the latest researches and practices on software patterns and quality. Finally, we will discuss several topics related to these presentations in small groups. Newcomers, interested researchers and practitioners are free to attend the workshop to facilitate their understandings, researches and practices on software patterns and quality.

: http://publica.fraunhofer.de/documents/N-188199.html