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Effect of chemical surface pre-treatment on reliability of AlGaN/GaN HEMTs

 
: Cäsar, M.; Dammann, M.; Waltereit, P.; Bronner, W.; Baeumler, M.; Quay, R.; Mikulla, M.; Ambacher, O.

JEDEC, Arlington/Va.:
26th Annual JEDEC ROCS Workshop 2011 : Proceedings, 16 May 2011, Indian Wells, California
Arlington/Va.: JEDEC, 2011
pp.107-118
Reliability of Compound Semiconductors Workshop (ROCS) <26, 2011, Indian Wells/Calif.>
English
Conference Paper
Fraunhofer IAF ()

: http://publica.fraunhofer.de/documents/N-186383.html